Electron
Microscopy
The electron microscopy component of Materials Science Central Facilities
includes scanning electron microscopes, transmission electron microscopes and even an
atomic force microscope, plus, staff to support these instruments and the faculty,
students and researchers who use them. It is also complemented by specimen
preparation equipment and other analytical instruments (optical microscopy, thermal
analysis, powder x-ray diffraction) which are also part of Central Facilities, making it
one arm of this department's growing research and teaching infrastructure. But this
is not merely a departmental facility. It is here to provide electron microscopy and
microanalytical support for anyone on campus who finds our instruments appropriate for
their research and teaching needs.
Our Focus on "Hard Specimen" Analyses
Our mission is focuses on the needs of primarily the "hard specimen"
research and teaching community, which is, after all, our area of expertise. This
focus will allow us to optimize our instruments for the unique needs of "hard
specimen" microanalysis and to invest in specialized features such as OIM or
cathodoluminesence, not to mention all of the necessary specimen preparation equipment
that such a facility needs. And just as one instrument can never be best at every
type of analysis our people will be able to concentrate on issues that are important to
the materials community. However, through our acquisition of equipment and personnel
from the Facility for Advanced Instrumentation we are also able to meet many of the
routine needs of the "soft" specimen" community (organic, biological and
other high-vapor pressure-type specimens).
The CHMS/FAI Consolidation
The current configuration of the electron microscopy component of Central
Facilities represents the best of the equipment from the Facility for Advanced
Instrumentation and the Division of Materials Science. Both groups had maintained
separate facilities for years and had worked together on many projects, but now with all
equipment and personnel working together under one roof and within one department we can
all look forward to a greater variety of services, access to a wider range of analytical
instruments and support equipment, and better support for teaching and research. The
consolidation of FAI's and Materials Science's instruments and personnel has barely begun
and naturally it will take us a little while before things settle down.
Nevertheless, we expect to be able to continue supporting our users with barely any break
in service as the microscopes are being moved from Hutchison Hall to Engineering II.
Support for Teaching
We are very interested in working with instructors who may want to include
advanced electron imaging and microanalysis in their graduate, undergraduate or extension
courses. As part of an academic department we do have a teaching mission and are in
fact are already involved in a number of the undergraduate and graduate materials science
laboratory courses. We see the opportunity to teach advanced analytical techniques
as not only part of our teaching mission but as a vital ingredient in our research
programs. Proper instruction in essential research methods can only improve the
quality of research and therefore our ability to continue to improve our standing in the
research community.
Contacting Us
If you would like to learn more about this facility and how it might serve your
research or teaching needs please phone or email us.
Fred Hayes, Director/Staff Microscopist
530/752-5166
fahayes@ucdavis.edu
Scanning
Electron Microscopy
We currently have one scanning electron microscope, an ISI-DS. This
SEM offers the teaching and research community an excellent tool for high-resolution,
high-depth of field imaging and elemental analysis. While it is a relatively old
instrument it is in excellent working condition, is easy to use, has been very reliable
and performs at a level the exceeds the needs of over 90 percent of its users.
(The nano-technology folks are anxiously awaiting the arrival of a new FEG-SEM) But
it is not without its modern features; a digital image capture system and an EDS
system. Best of all, we can offer excellent technical support, training,
consultations and support for graduate, undergraduate and extension courses.
Transmission Electron Microscopy
With our two transmission electron microscopes we are able to perform a
wide range of TEM-based analyses. Our Hitachi H-600 has been used at FAI for years
in studies ranging from plant and animal tissue analyses to the dislocation structures in
nanocrystalline nickel. It is a very capable general purpose TEM, able to provide
the contrast needed in the analysis of biological specimens and the resolution coupled
with the ability to perform electron diffraction and EDS analyses on a variety of types of
engineering materials. The Philips CM-12 is our materials science-only TEM.
Its optics are optimized for large tilt angle, rather than contrast or resolution, and
with its LaB6 gun it is capable of over twice the magnification of our Hitachi
TEM. It is also capable of convergent beam imaging, scanning transmission electron
(STEM) imaging and EDS analyses.
Scanning Probe Microscopy
While not exactly an electron microscope our Topometrics AFM is a perfect
compliment to our SEM. It allows one to obtain high-resolution topographic images of
specimens which cannot be placed in a vacuum or subjected to an electron beam.
In fact. specimens can be immersed in liquids or not and the scan can involve
contact with the probe, or not.
Division of Materials Science
If you have any questions or comments regarding this web site please contact the webmaster.
Updated on June 25, 2001
Department of Chemical Engineering and Materials Science
University of California, Davis
Davis, CA 95616
USA
Phone: 530/752-0400
Web: www.chms.ucdavis.edu